Development of the Field Ion-scanning Tunneling Microscope and Its Applications
نویسندگان
چکیده
A scanning tunneling microscope (STM) equipped with a field ion microscope (FIM) which operates at room temperature has been constructed and operated successfully to obtain atomically resolved STM images with 100% reproducibility. This instrument, which we call the FI-STM, has been employed for the quantitative study of the Si(100) "2xn" phase.
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